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BFM 40-150, beam flux monitor on DN40 CF (O.D. 2.75") with edge-welded bellows and linear travel 150mm (gauge head shielding parts removed) |
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- Bayard-Alpert type ionization gauge
- Compatible with AML gauge controllers
- Mounting flange DN40 CF (O.D. 2.75")
- Linear gauge head positioning
- Standard linear travel 150mm
- Bakeable up to 250°C
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In many MBE applications the beam equivalent pressure (BEP) of the atomic or molecular beams from effusion cells can
be used to determine flux ratios and growth rates near or at the sample position. Our Beam Flux Monitor BFM has been designed and optimized for this purpose.
The basic component of the BFM is the Bayard-Alpert type ionisation gauge, that is mounted on a linear motion feedthrough
with edge-welded bellows. By means of this feedthrough, the gauge can be shifted linearly between a measurement- and a
standby-position.
The design of the BFM includes the shielding of the gauge head, inhibiting contamination of a substrate
behind the gauge head during flux-monitoring. The shielding parts can be seen on the right hand figure.
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View onto gauge head of BFM 40-150, complete assembly with gauge head shielding |
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