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Bayard-Alpert type ionization gauge
Compatible with AML gauge controllers
Mounting flange DN40 CF (O.D. 2.75")
Linear gauge head positioning
Standard linear travel 150 mm
Bakeable up to 250°C
In many MBE applications the beam equivalent pressure (BEP) of the atomic or molecular beams from effusion cells can be used to determine flux ratios and growth rates near or at the sample position. Our Beam Flux Monitor BFM has been designed and optimized for this purpose. |
View onto gauge head of BFM 40-150, complete assembly with gauge head shielding |
Typical applications for the BFM beam flux monitor are:
- flux calibration of effusion cells vs. source temperature
- fast check of flux ratios from different sources before growth (e.g. As/Ga in III-V MBE)
The BFM series has been designed to be pin-compatible with ion gauge controllers of the PGC-series from AML. The electrical 12-pin feedthrough of the BFM mates with a standard AML gauge head connection cable. If other ion gauge controllers shall be used, adaptability to the pin-out shown on the left and match with the characteristics of the ion gauge head (see below) is required.
Ion Gauge Head Specifications (when used with AML controller):
|
BFM 40-150 air side view |
Technical data |
|
Mounting flange | DN40 CF (O.D. 2.75") [mm / inch]; port I.D. >= 38 mm |
Dimensions | ( L x W x H ) 380 x 94 x 105 mm (BFM 40-150) |
In-vacuum length | 123 mm retracted / 273 mm extended (BFM 40-150) |
Linear travel | 150 mm standard, other on request |
Bakeout temperature | up to 250 °C |
Controller | AML PGC-series or compatible; other (e.g. Granville-Phillips) on request |
Electrical connectors | pin-compatible with AML controller cables |
Measurement range | 10-3 mbar to 4x10-11 mbar total pressure or BEP |
Degas principle | electron bombardment |
Schematic drawing of the Beamfluxmonitor BFM |