Warning: Undefined array key "HTTP_ACCEPT_ENCODING" in /mnt/web508/d3/15/536615/htdocs/relaunch.mbe-komponenten.de/includes/general.inc.php on line 15 Deprecated: preg_match(): Passing null to parameter #2 ($subject) of type string is deprecated in /mnt/web508/d3/15/536615/htdocs/relaunch.mbe-komponenten.de/includes/general.inc.php on line 15 in-situ characterization tool - Keyword
Keywords

Keyword: in-situ characterization tool

Stichwort "in-situ characterization tool" in "Online Editor":

in-situ characterization tool in OCTOPLUS 400 - Dr. Eberl MBE-Komponenten GmbH
OCTOPLUS 400 systems are ideally suited for III-V, II-VI and other compound semiconductor applications. The OCTOPLUS 400 can be adapted to small wafer segments.
in-situ characterization tool in OCTOPLUS 300 - Dr. Eberl MBE-Komponenten GmbH
The OCTOPLUS 300 system is ideally suited for material deposition onto small samples. It ensures a good accessability and easy operation and maintenance.